Scanning Electron Microscope AI

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Object of the Procurement

  • What is being procured: Scanning Electron Microscope (SEM) with Energy-Dispersive X-ray Microanalyzer (EDS/EDX). This constitutes one equipment set.
  • Main technical requirements, characteristics:
    • Purpose: Analysis of the microstructure, wear mechanisms, composition, and manufacturing/processing quality of ceramic, metallic, polymer, and composite materials.
    • SEM type: Floor model with a thermal W-type emitter (not FEG SEM).
    • Performance: The time taken from starting up to obtaining the first SEM image…
       
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290090_ESPD_v2.0_laiendatud.xml

290090_hankepass_taiendavate_selgitustega.pdf

290090_hindamiskriteeriumid.pdf

290090_vastavustingimused.pdf

290090.zip

Hanke alusdokumendid.docx

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