Purchase of an Ion Beam Scanning Electron Microscope AI

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Subject of Procurement

  • Item to be procured: Purchase of an Ion Beam Scanning Electron Microscope (FIB-SEM).
  • Main technical requirements, features:
    • The instrument must combine a high-resolution FE-SEM and FIB capability, with EDS/EDX and EBSD options on a single platform.
    • Fast loading system (loadlock/airlock) required for sample exchange without breaking vacuum.
    • Integrated manipulator required with at least 4-axis control (x, y, z, rotation) for in-situ TEM lamella removal (needle rotation…
       
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302122_ESPD_v2.0_laiendatud.xml

302122_hankepass_taiendavate_selgitustega.pdf

302122_hindamiskriteeriumid.pdf

302122_vastavustingimused.pdf

302122.zip

Annex 2 - 3 (forms).docx

Annex 4 Draft Procurement Contract (12112025).pdf

Hankedokument, Tender Document (115).pdf

Instructions for participating in the tendering procedure.pdf

Juhised hankemenetluses osalemiseks.pdf

Lisa 1 Tehniline kirjeldus, Annex 1 Technical description (12112025).docx

Lisa 1 Tehniline kirjeldus, Annex 1 Technical description (12112025).pdf

Lisa 2 - 3 (vormid).docx

Lisa 4 Hankelepingu kavand (12112025).pdf

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