Near-field optical microscopy system with cryogenic sample cooling and time-resolved spectral measurement capability AI

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Subject of Purchase

  • What is being purchased: Near-field optical microscopy system with cryogenic sample cooling and time-resolved spectral measurement capability (goods).
  • Main technical requirements, features:
    • Platform: Dual-probe AFM/SNOM system (specify manufacturer and model number).
    • Number of probes: At least two fully independent probes.
    • Measurement modes: AFM, SNOM, multi-probe thermal, electrical, resistance measurements, optical pump-probe.
    • Scanning resolution (minimum values): Z-axis <0.05 nm, XY-axis <0.15 nm (voltage mode <0.02 nm)…
       
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Rinkos_konsultacija/Klausimynas.docx

Rinkos_konsultacija/Rinkos konsultacija.docx

Rinkos_konsultacija/TECHNINĖ SPECIFIKACIJA.docx

Rinkos_konsultacija.zip

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